By Wilhelmus Jacobus Witteman
This entire monograph offers with detectors, sign processors and similar noise phenomena. specified quantitative analyses are built in a constant structure for thermal detectors, vacuum detectors, semiconductor detectors and avalanche detectors, in addition to their accompanying noise currents. For sign processing applocations, the monograph treats intimately the operational amplifier, sign averagers, waveform analyzers, correlation options and heterodyne detection. a number of unique extensions are pronounced, particularly for correlation units and heterodyne detection with noise rejection. moreover, result of analyses are illustrated with examples of working platforms and of purposes in area conversation and laser radar.
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Extra info for Detection and Signal Processing: Technical Realization
64) 1 + (ωRL C) where C is the electrical capacitance and RL the load or shunt resistance which is usually much smaller than the internal resistance of the detector. 64) |r| = ωAKp λ (1 + RL 2 )1/2 ω 2 τth 1 + (ωRL C) 2 1/2 . 66) and for high frequencies, 1/τth < ω < 1/RL C, the response is constant and given by AKp RL . 67) r= Cth The smaller the load resistance the larger the frequency range with constant response which is independent of both frequency and thermal conductivity. 3 Pyroelectric Detector 47 log r [V W -1] R = 109 W 4 R = 108 W 3 R = 107 W 2 R = 106 W 1 2 1 3 log w 5 4 Fig.
4, where F depends on both frequency and load impedance. As the input impedance is much larger than the connected load RL , the Johnson input noise voltage is given by vn2 = 4kT0 RL B . 30) At the output this noise power is (vn2 )out = G2 (vn2 )in . 29) as voltage from the ampliﬁer, seen at the output, as vexc 2 F = 1 G Sin Nout = 2 Sout Nin G vn2 in vn2 2 + vexc in =1+ 2 vexc G2 vn2 . 31) 30 2 Signal–Noise Relations Load resistance (Ohms) 100k 6 dB 3 dB 2 dB 10k 1 dB 1 dB 1k 2 dB 3 dB 100 6 dB 10 15 dB 10 dB 1 10 100 1K 10K Frequency (Hz) 100K 1M Fig.
Taking a detector area A = 1 mm2 and a thickness t = 10 µm the electrical capacitance C = εr ε0 A/t = 22 pF. 2 × 105 Ω. 64 × 10−5 [J K−1 ]. 8 [V W−1 ]. 2 × 10−8 [W Hz−1/2 ]. 2) we ﬁnd D∗ = 8 × 106 [W−1 cm Hz1/2 ]. For a smaller frequency range the shunt resistance becomes larger and consequently also D∗ . 2 Ω and the NEP becomes 4 × 10−6 [W Hz−1/2 ]. 2 × 10−9 J. The damage threshold of thermal power will determine the maximum pulse rate that can be detected, wheras ablation of the detector surface may limit the maximum allowable pulse power.
Detection and Signal Processing: Technical Realization by Wilhelmus Jacobus Witteman